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Beilstein J. Nanotechnol. 2019, 10, 1056–1064, doi:10.3762/bjnano.10.106
Figure 1: Phase shift as a function of the tip–substrate distance z; calculated for a silicon substrate with V...
Figure 2: Substrate without dielectric layer and with dielectric layer. The dielectric layer allows the tip t...
Figure 3: Phase shift due to capacitive coupling as a function of the lift height for nanoparticles with 10 n...
Figure 4: a) Sketch of a MFM measurement of a dielectric layer with defined roughness (Rmax); b) Simulation f...
Figure 5: Schematic representation of the distance between tip and nanoparticle dipole during the interleave ...
Figure 6: Simulation of the MFM phase for a single SPION using a Gaussian topographic profile corresponding t...
Figure 7: Phase shift above nanoparticles (10 ± 2 nm) on dielectric layers of various thicknesses as a functi...
Figure 8: Calculated (; black line) and measured phase shift for single nanoparticles with 10 ± 2 nm diameter...
Figure 9: Measurement of a single SPION with 10 ± 2 nm diameter on a silicon substrate with a dielectric laye...
Figure 10: Measurement of a single SPION with 12 ± 1 nm diameter on a silicon substrate recorded with an ASYMF...